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Mechanism of Cluster DNA Damage Repair in Response to High-Atomic Number and Energy Particles Radiation
Low-linear energy transfer (LET) radiation (i.e., γ- and X-rays) induces DNA double-strand breaks (DSBs) that are rapidly repaired (rejoined). In contrast, DNA damage induced by the dense ionizing track of high-atomic number and energy (HZE) particles are slowly repaired or are irreparable. These un...
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| Main Authors: | , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
2010
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3318975/ https://ncbi.nlm.nih.gov/pubmed/21126526 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.mrfmmm.2010.11.002 |
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