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Direct electron detection yields cryo-EM reconstructions at resolutions beyond ¾ Nyquist frequency
One limitation in electron cryo-microscopy (cryo-EM) is the inability to recover high-resolution signal from the image-recording media at the full-resolution limit of the transmission electron microscope. Direct electron detection using CMOS-based sensors for digitally recording images has the poten...
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| Main Authors: | , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2012
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3314222/ https://ncbi.nlm.nih.gov/pubmed/22285189 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2012.01.008 |
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