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Compensator design for improved counterbalancing in high speed atomic force microscopy
High speed atomic force microscopy can provide the possibility of many new scientific observations and applications ranging from nano-manufacturing to the study of biological processes. However, the limited imaging speed has been an imperative drawback of the atomic force microscopes. One of the mai...
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| Main Authors: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American Institute of Physics
2011
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3298558/ https://ncbi.nlm.nih.gov/pubmed/22128989 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.3663070 |
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