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Simplistic Attachment and Multispectral Imaging with Semiconductor Nanocrystals

Advances in spectral deconvolution technologies are rapidly enabling researchers to replace or enhance traditional epifluorescence microscopes with instruments capable of detecting numerous markers simultaneously in a multiplexed fashion. While significantly expediting sample throughput and elucidat...

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Detalhes bibliográficos
Main Authors: Jennings, Travis L., Triulzi, Robert C., Tao, Guoliang, St. Louis, Zachary E., Becker-Catania, Sara G.
Formato: Artigo
Idioma:Inglês
Publicado em: Molecular Diversity Preservation International (MDPI) 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3274300/
https://ncbi.nlm.nih.gov/pubmed/22346658
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s111110557
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