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Armand Imbert, Adolf Fick, and their tonometry law
‘The basis of tonometry by applanation, even of tonometry as a whole, is Fick's law, or Imbert-Fick's law, which actually is a much more accurate name'. It is affirmatively cited solely in the ophthalmic and optometric literature, and in patent applications for new tonometers, but as...
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2012
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| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3259585/ https://ncbi.nlm.nih.gov/pubmed/22020170 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/eye.2011.248 |
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