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X-ray near-field speckle: implementation and critical analysis

The newly introduced coherence-based technique of X-ray near-field speckle (XNFS) has been implemented at 8-ID-I at the Advanced Photon Source. In the near-field regime of high-brilliance synchrotron X-rays scattered from a sample of interest, it turns out that, when the scattered radiation and the...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Lu, Xinhui, Mochrie, S. G. J., Narayanan, S., Sandy, A. R., Sprung, M.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2011
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC3258091/
https://ncbi.nlm.nih.gov/pubmed/21997906
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049511037149
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