Carregant...

Inverse Problem in Nondestructive Testing Using Arrayed Eddy Current Sensors

A fast crack profile reconstitution model in nondestructive testing is developed using an arrayed eddy current sensor. The inverse problem is based on an iterative solving of the direct problem using genetic algorithms. In the direct problem, assuming a current excitation, the incident field produce...

Descripció completa

Guardat en:
Dades bibliogràfiques
Autors principals: Zaoui, Abdelhalim, Menana, Hocine, Feliachi, Mouloud, Berthiau, Gérard
Format: Artigo
Idioma:Inglês
Publicat: Molecular Diversity Preservation International (MDPI) 2010
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC3231224/
https://ncbi.nlm.nih.gov/pubmed/22163680
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s100908696
Etiquetes: Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!