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Practical factors affecting the performance of a thin-film phase plate for transmission electron microscopy

A number of practical issues must be addressed when using thin carbon films as quarter-wave plates for Zernike phase-contrast electron microscopy. We describe, for example, how we meet the more stringent requirements that must be satisfied for beam alignment in this imaging mode. In addition we addr...

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Detalhes bibliográficos
Main Authors: Danev, Radostin, Glaeser, Robert M., Nagayama, Kuniaki
Formato: Artigo
Idioma:Inglês
Publicado em: 2008
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3223123/
https://ncbi.nlm.nih.gov/pubmed/19157711
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2008.12.006
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