Jacques, E., Pichon, L., Debieu, O., & Gourbilleau, F. (2011). Electrical behavior of MIS devices based on Si nanoclusters embedded in SiO(x)N(y )and SiO(2 )films. Springer.
Citação norma ChicagoJacques, Emmanuel, Laurent Pichon, Olivier Debieu, and Fabrice Gourbilleau. Electrical Behavior of MIS Devices Based On Si Nanoclusters Embedded in SiO(x)N(y )and SiO(2 )films. Springer, 2011.
Citação norma MLAJacques, Emmanuel, Laurent Pichon, Olivier Debieu, and Fabrice Gourbilleau. Electrical Behavior of MIS Devices Based On Si Nanoclusters Embedded in SiO(x)N(y )and SiO(2 )films. Springer, 2011.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.