APA ציטוט

Jacques, E., Pichon, L., Debieu, O., & Gourbilleau, F. (2011). Electrical behavior of MIS devices based on Si nanoclusters embedded in SiO(x)N(y )and SiO(2 )films. Springer.

Citação norma Chicago

Jacques, Emmanuel, Laurent Pichon, Olivier Debieu, and Fabrice Gourbilleau. Electrical Behavior of MIS Devices Based On Si Nanoclusters Embedded in SiO(x)N(y )and SiO(2 )films. Springer, 2011.

ציטוט MLA

Jacques, Emmanuel, Laurent Pichon, Olivier Debieu, and Fabrice Gourbilleau. Electrical Behavior of MIS Devices Based On Si Nanoclusters Embedded in SiO(x)N(y )and SiO(2 )films. Springer, 2011.