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Eriksson, Jens, Fabrizio Roccaforte, Sergey Reshanov, Stefano Leone, Filippo Giannazzo, Raffaella LoNigro, Patrick Fiorenza, and Vito Raineri. Nanoscale Characterization of Electrical Transport At Metal/3C-SiC Interfaces. Springer, 2011.

Eriksson, Jens, et al. Nanoscale Characterization of Electrical Transport At Metal/3C-SiC Interfaces. Springer, 2011.