Eriksson, J., Roccaforte, F., Reshanov, S., Leone, S., Giannazzo, F., LoNigro, R., . . . Raineri, V. (2011). Nanoscale characterization of electrical transport at metal/3C-SiC interfaces. Springer.
Styl ChicagoEriksson, Jens, Fabrizio Roccaforte, Sergey Reshanov, Stefano Leone, Filippo Giannazzo, Raffaella LoNigro, Patrick Fiorenza, a Vito Raineri. Nanoscale Characterization of Electrical Transport At Metal/3C-SiC Interfaces. Springer, 2011.
Citace podle MLAEriksson, Jens, et al. Nanoscale Characterization of Electrical Transport At Metal/3C-SiC Interfaces. Springer, 2011.
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