Electric field and grain size dependence of Meyer–Neldel energy in C(60) films

Meyer–Neldel rule for charge carrier mobility measured in C(60)-based organic field-effect transistors (OFETs) at different applied source drain voltages and at different morphologies of semiconducting fullerene films was systematically studied. A decrease in the Meyer–Neldel energy E(MN) from 36 me...

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Detalhes bibliográficos
Main Authors: Ullah, Mujeeb, Pivrikas, A., Fishchuk, I.I., Kadashchuk, A., Stadler, P., Simbrunner, C., Sariciftci, N.S., Sitter, H.
Formato: Artigo
Idioma:Inglês
Publicado em: Elsevier Sequoia] 2011
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Article
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3174423/
https://ncbi.nlm.nih.gov/pubmed/21966084
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.synthmet.2011.07.008
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