Yıldız, D. E., & Dökme, İ. (2011). Frequency and gate voltage effects on the dielectric properties and electrical conductivity of Al∕SiO(2)∕p-Si metal-insulator-semiconductor Schottky diodes. American Institute of Physics.
Citação norma ChicagoYıldız, D. E., and İ Dökme. Frequency and Gate Voltage Effects On the Dielectric Properties and Electrical Conductivity of Al∕SiO(2)∕p-Si Metal-insulator-semiconductor Schottky Diodes. American Institute of Physics, 2011.
Deismireacht MLAYıldız, D. E., and İ Dökme. Frequency and Gate Voltage Effects On the Dielectric Properties and Electrical Conductivity of Al∕SiO(2)∕p-Si Metal-insulator-semiconductor Schottky Diodes. American Institute of Physics, 2011.
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