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Coaxial atomic force microscope probes for imaging with dielectrophoresis
We demonstrate atomic force microscope (AFM) imaging using dielectrophoresis (DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole,...
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| 主要な著者: | , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
American Institute of Physics
2011
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3104049/ https://ncbi.nlm.nih.gov/pubmed/21629565 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.3585670 |
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