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Zernike phase contrast in scanning microscopy with X-rays

Scanning X-ray microscopy focuses radiation to a small spot and probes the sample by raster scanning. It allows information to be obtained from secondary signals such as X-ray fluorescence, which yields an elemental mapping of the sample not available in full-field imaging. The analysis and interpre...

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Bibliografiske detaljer
Main Authors: Holzner, Christian, Feser, Michael, Vogt, Stefan, Hornberger, Benjamin, Baines, Stephen B., Jacobsen, Chris
Format: Artigo
Sprog:Inglês
Udgivet: 2010
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3085486/
https://ncbi.nlm.nih.gov/pubmed/21544232
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