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STED-SPIM: Stimulated Emission Depletion Improves Sheet Illumination Microscopy Resolution

We demonstrate the first, to our knowledge, integration of stimulated emission depletion (STED) with selective plane illumination microscopy (SPIM). Using this method, we were able to obtain up to 60% improvements in axial resolution with lateral resolution enhancements in control samples and zebraf...

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Detalhes bibliográficos
Main Authors: Friedrich, Mike, Gan, Qiang, Ermolayev, Vladimir, Harms, Gregory S.
Formato: Artigo
Idioma:Inglês
Publicado em: The Biophysical Society 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3077687/
https://ncbi.nlm.nih.gov/pubmed/21504720
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.bpj.2010.12.3748
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