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STED-SPIM: Stimulated Emission Depletion Improves Sheet Illumination Microscopy Resolution
We demonstrate the first, to our knowledge, integration of stimulated emission depletion (STED) with selective plane illumination microscopy (SPIM). Using this method, we were able to obtain up to 60% improvements in axial resolution with lateral resolution enhancements in control samples and zebraf...
שמור ב:
| Main Authors: | , , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
The Biophysical Society
2011
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3077687/ https://ncbi.nlm.nih.gov/pubmed/21504720 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.bpj.2010.12.3748 |
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