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A NEW NON-DESTRUCTIVE METHOD FOR CHEMICAL ANALYSIS OF PARTICULATE MATTER FILTERS: THE CASE OF MANGANESE AIR POLLUTION IN VALLECAMONICA (ITALY)

Total Reflection X-ray Fluorescence (TXRF) is a well-established technique for chemical analysis, but it is mainly employed for quality control in the electronics semiconductor industry. The capability to analyze liquid and uniformly thin solid samples makes this technique suitable for other applica...

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Detalhes bibliográficos
Main Authors: Borgese, Laura, Zacco, Annalisa, Pal, Sudipto, Bontempi, Elza, Lucchini, Roberto, Zimmerman, Neil, Depero, Laura E.
Formato: Artigo
Idioma:Inglês
Publicado em: 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3056347/
https://ncbi.nlm.nih.gov/pubmed/21315919
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.talanta.2010.12.048
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