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X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe

Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 µm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied...

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Detalhes bibliográficos
Main Authors: Specht, E. D., Walker, F. J., Liu, Wenjun
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2010
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3025476/
https://ncbi.nlm.nih.gov/pubmed/20157279
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049509052078
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