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Ultrastable Atomic Force Microscopy: Atomic-Scale Stability and Registration in Ambient Conditions
Instrumental drift in atomic force microscopy (AFM) remains a critical, largely unaddressed issue that limits tip–sample stability, registration, and the signal-to-noise ratio during imaging. By scattering a laser off the apex of a commercial AFM tip, we locally measured and thereby actively control...
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| Hlavní autoři: | , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2009
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2953871/ https://ncbi.nlm.nih.gov/pubmed/19351191 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/nl803298q |
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