Antonuk, L., Koniczek, M., McDonald, J., El-Mohri, Y., Zhao, Q., & Behravan, M. (2008). Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based on Active Pixel Architectures.

Antonuk, L.E., M. Koniczek, J. McDonald, Y. El-Mohri, Q. Zhao, ja M. Behravan. Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based On Active Pixel Architectures. 2008.

Antonuk, L.E., et al. Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based On Active Pixel Architectures. 2008.