High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

The concepts and technical realisation of the high-resolution soft X-ray beamline ADRESS operating in the energy range from 300 to 1600 eV and intended for resonant inelastic X-ray scattering (RIXS) and angle-resolved photoelectron spectroscopy (ARPES) are described. The photon source is an undulato...

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Bibliografische gegevens
Hoofdauteurs: Strocov, V. N., Schmitt, T., Flechsig, U., Schmidt, T., Imhof, A., Chen, Q., Raabe, J., Betemps, R., Zimoch, D., Krempasky, J., Wang, X., Grioni, M., Piazzalunga, A., Patthey, L.
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: International Union of Crystallography 2010
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Research Papers
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC2927903/
https://ncbi.nlm.nih.gov/pubmed/20724785
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049510019862
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