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Phase-space analysis and experimental results for secondary focusing at X-ray beamlines

Micro-focusing optical devices at synchrotron beamlines usually have a limited acceptance, but more flux can be intercepted if such optics are used to focus secondary sources created by the primary optics. Flux throughput can be maximized by placing the secondary focusing optics close to or exactly...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Huang, Rong, Meron, Mati, Kujala, Naresh, Barrea, Raul A.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2010
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC2924791/
https://ncbi.nlm.nih.gov/pubmed/20724786
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049510024337
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