Carregant...

Triaxial Atomic Force Microscope Contact-Free Tweezers for Nanoassembly

We propose a Traixial Atomic Force Microscope (AFM) Contact-free Tweezer (TACT) for the controlled assembly of nanoparticles suspended in a liquid. The TACT overcomes four major challenges faced in nanoassembly: (1) The TACT can hold and position a single nanoparticle with spatial accuracy smaller t...

Descripció completa

Guardat en:
Dades bibliogràfiques
Autors principals: Brown, Keith A, Westervelt, Robert M
Format: Artigo
Idioma:Inglês
Publicat: 2009
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC2885835/
https://ncbi.nlm.nih.gov/pubmed/19713582
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/0957-4484/20/38/385302
Etiquetes: Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!