Dunlop, I. E., Zorn, S., Richter, G., Srot, V., Kelsch, M., van Aken, P. A., . . . Schreiber, F. (2009). Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy.
Citação norma ChicagoDunlop, Iain E., et al. Titanium-silicon Oxide Film Structures for Polarization-modulated Infrared Reflection Absorption Spectroscopy. 2009.
ציטוט MLADunlop, Iain E., et al. Titanium-silicon Oxide Film Structures for Polarization-modulated Infrared Reflection Absorption Spectroscopy. 2009.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.