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Dual Axis Target Mapping and Automated Sequential Acquisition of Dual Axis EM Tomographic Data

Dual-axis electron microscopic tomography minimizes the missing wedge-induced resolution loss by taking two complementary tilt data sets of the same target along two orthogonal axes. The potential of this powerful approach has been hampered by the practical challenges inherent in finding the origina...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Zheng, Shawn Q., Matsuda, Atsushi, Braunfeld, Michael B., Sedat, John W., Agard, David A.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: 2009
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC2776717/
https://ncbi.nlm.nih.gov/pubmed/19545637
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2009.06.010
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