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Trap profiles of projector based optoelectronic tweezers (OET) with HeLa cells

In this paper we present trap profile measurements for HeLa cells in Optoelectronic Tweezers (OET) based on a data projector. The data projector is used as a light source to illuminate amorphous Si creating virtual electrodes which are used to trap particles through dielectrophoresis. We show that a...

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Detalles Bibliográficos
Main Authors: Neale, Steven L., Ohta, Aaron T., Hsu, Hsan-Yin, Valley, Justin K., Jamshidi, Arash, Wu, Ming C.
Formato: Artigo
Idioma:Inglês
Publicado: 2009
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC2752501/
https://ncbi.nlm.nih.gov/pubmed/19333286
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