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Mapping microscope object polarized emission to the back focal plane pattern

The back focal plane (BFP) intensity pattern from a high-aperture objective separately maps far- and near-field emission from dipoles near a bare glass or metal-film-coated glass/aqueous interface. Total internal reflection (TIR) excitation of a fluorescent sample gave a BFP pattern interpreted in t...

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Autors principals: Burghardt, Thomas P., Ajtai, Katalin
Format: Artigo
Idioma:Inglês
Publicat: 2009
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC2745092/
https://ncbi.nlm.nih.gov/pubmed/19566329
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/1.3155520
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