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Mapping microscope object polarized emission to the back focal plane pattern
The back focal plane (BFP) intensity pattern from a high-aperture objective separately maps far- and near-field emission from dipoles near a bare glass or metal-film-coated glass/aqueous interface. Total internal reflection (TIR) excitation of a fluorescent sample gave a BFP pattern interpreted in t...
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| Autors principals: | , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
2009
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2745092/ https://ncbi.nlm.nih.gov/pubmed/19566329 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/1.3155520 |
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