Dubey, M., Emoto, K., Cheng, F., Gamble, L. J., Takahashi, H., Grainger, D. W., & Castner, D. G. (2009). Surface Analysis of Photolithographic Patterns using ToF-SIMS and PCA.
Stile di citazione ChicagoDubey, Manish, Kazunori Emoto, Fang Cheng, Lara J. Gamble, Hironobu Takahashi, David W. Grainger, e David G. Castner. Surface Analysis of Photolithographic Patterns Using ToF-SIMS and PCA. 2009.
Citazione MLADubey, Manish, et al. Surface Analysis of Photolithographic Patterns Using ToF-SIMS and PCA. 2009.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.