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Photoacoustic technique to measure beam profile of pulsed laser systems
The beam profiles of pulsed lasers are currently measured using either complementary metal oxide semiconductor (CMOS) or charge coupled device (CCD) cameras. Despite providing high-resolution beam profiles, these devices cannot work with high power lasers. If additional optical attenuators are used,...
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| 主要な著者: | , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
American Institute of Physics
2009
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2736568/ https://ncbi.nlm.nih.gov/pubmed/19485524 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.3125625 |
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