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A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy
Electron microscopists are increasingly turning to intermediate voltage electron microscopes (IVEMs) operating at 300–400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device (CCD) cameras, which have become widely used on electron microscope...
Bewaard in:
| Hoofdauteurs: | , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
American Institute of Physics
2008
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2678785/ https://ncbi.nlm.nih.gov/pubmed/18447528 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.2902853 |
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