X-ray diffractometry for the structure determination of a submicrometre single powder grain

A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of t...

Täydet tiedot

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Bibliografiset tiedot
Päätekijät: Yasuda, Nobuhiro, Murayama, Haruno, Fukuyama, Yoshimitsu, Kim, Jungeun, Kimura, Shigeru, Toriumi, Koshiro, Tanaka, Yoshihito, Moritomo, Yutaka, Kuroiwa, Yoshihiro, Kato, Kenichi, Tanaka, Hitoshi, Takata, Masaki
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: International Union of Crystallography 2009
Aiheet:
Research Papers
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC2678016/
https://ncbi.nlm.nih.gov/pubmed/19395798
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S090904950900675X
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