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Determination of X-ray flux using silicon pin diodes
Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here...
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| Main Authors: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2009
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2651761/ https://ncbi.nlm.nih.gov/pubmed/19240326 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049508040429 |
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