Loading...
A practical exposure-equivalent metric for instrumentation noise in x-ray imaging systems
The performance of high-sensitivity x-ray imagers may be limited by additive instrumentation noise rather than by quantum noise when operated at the low exposure rates used in fluoroscopic procedures. The equipment-invasive instrumentation noise measures (in terms of electrons) are generally difficu...
Na minha lista:
| Main Authors: | , , , , , |
|---|---|
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
2008
|
| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2562256/ https://ncbi.nlm.nih.gov/pubmed/18723932 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/0031-9155/53/18/017 |
| Tags: |
Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
|