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A practical exposure-equivalent metric for instrumentation noise in x-ray imaging systems
The performance of high-sensitivity x-ray imagers may be limited by additive instrumentation noise rather than by quantum noise when operated at the low exposure rates used in fluoroscopic procedures. The equipment-invasive instrumentation noise measures (in terms of electrons) are generally difficu...
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| Autors principals: | , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
2008
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2562256/ https://ncbi.nlm.nih.gov/pubmed/18723932 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/0031-9155/53/18/017 |
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