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Plasmid-Determined Copper Resistance in Pseudomonas syringae from Impatiens

A strain of Pseudomonas syringae was recently identified as the cause of a new foliar blight of impatiens. The bacterium was resistant to copper compounds, which are used on a variety of crops for bacterial and fungal disease control. The bacterium contained a single 47-kilobase plasmid (pPSI1) that...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Cooksey, Donald A.
Format: Artigo
Sprache:Inglês
Veröffentlicht: 1990
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC183243/
https://ncbi.nlm.nih.gov/pubmed/16348085
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