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Plasmid-Determined Copper Resistance in Pseudomonas syringae from Impatiens

A strain of Pseudomonas syringae was recently identified as the cause of a new foliar blight of impatiens. The bacterium was resistant to copper compounds, which are used on a variety of crops for bacterial and fungal disease control. The bacterium contained a single 47-kilobase plasmid (pPSI1) that...

詳細記述

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書誌詳細
出版年:Appl Environ Microbiol
第一著者: Cooksey, Donald A.
フォーマット: Artigo
言語:Inglês
出版事項: American Society for Microbiology (ASM) 1990
主題:
オンライン・アクセス:https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC183243/
https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/16348085/
https://ncbi.nlm.nih.govhttps://doi.org/10.1128/aem.56.1.13-16.1990
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