Código QR (código de barras bidimensional)

Cloning and characterization of the region III flagellar operons of the four Shigella subgroups: genetic defects that cause loss of flagella of Shigella boydii and Shigella sonnei.

To detect genetic defects that might have caused loss of flagella in Shigella boydii and Shigella sonnei, the region III flagellar (fli) operons were cloned from certain strains and analyzed with reference to the restriction maps and genetic maps of Escherichia coli fli operons. S. boydii NCTC9733 (...

תיאור מלא

שמור ב:
מידע ביבליוגרפי
הוצא לאור ב:J Bacteriol
Principais autores: Al Mamun, A A, Tominaga, A, Enomoto, M
פורמט: Artigo
שפה:Inglês
יצא לאור: American Society for Microbiology (ASM) 1997
נושאים:
גישה מקוונת:https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC179284/
https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/9226258/
https://ncbi.nlm.nih.govhttps://doi.org/10.1128/jb.179.14.4493-4500.1997
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