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Rapid, depth-resolved light scattering measurements using Fourier domain, angle-resolved low coherence interferometry

We present a novel angle-resolved low coherence interferometry scheme for rapid measurement of depth-resolved angular scattering distributions to enable determination of scatterer size via elastic scattering properties. Depth resolution is achieved using a superluminescent diode in a modified Mach-Z...

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Detalhes bibliográficos
Main Authors: Pyhtila, John W., Wax, Adam
Formato: Artigo
Idioma:Inglês
Publicado em: 2004
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC1752217/
https://ncbi.nlm.nih.gov/pubmed/17195864
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