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Possible Involvement of Al-Induced Electrical Signals in Al Tolerance in Wheat.

The relationship between Al-induced depolarization of root-cell transmembrane electrical potentials (Em) and Al tolerance in wheat (Triticum aestivum L.) was investigated. Al exposure induced depolarizations of Em in the Al-tolerant wheat cultivars Atlas and ET3, but not in the Al-sensitive wheat cu...

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Publicat a:Plant Physiol
Autors principals: Papernik, L. A., Kochian, L. V.
Format: Artigo
Idioma:Inglês
Publicat: Oxford University Press 1997
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Accés en línia:https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC158526/
https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/12223834/
https://ncbi.nlm.nih.govhttps://doi.org/10.1104/pp.115.2.657
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