Interval Mapping of Quantitative Trait Loci for Resistance to Late Blight [Phytophthora infestans (Mont.) de Bary], Height and Maturity in a Tetraploid Population of Potato (Solanum tuberosum subsp. tuberosum)

Interval mapping of quantitative trait loci (QTL) for resistance to late blight, height, and maturity was performed on a tetraploid full-sib family of potato comprising 227 clones from a cross between a susceptible parent, 12601ab1, and a resistant cultivar, Stirling, which were of similar height an...

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Bibliografiset tiedot
Päätekijät: Bradshaw, John E., Pande, Barnaly, Bryan, Glenn J., Hackett, Christine A., McLean, Karen, Stewart, Helen E., Waugh, Robbie
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Genetics Society of America 2004
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Investigations
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC1448831/
https://ncbi.nlm.nih.gov/pubmed/15514069
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1534/genetics.104.030056
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