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Direct structural observation of a molecular junction by high-energy x-ray reflectometry
We report a direct angstrom resolution measurement of the structure of a molecular-size electronic junction comprising a single (or a double) layer of alkyl-thiol and alkyl-silane molecules at the buried interface between solid silicon and liquid mercury. The high-energy synchrotron x-ray measuremen...
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| Autors principals: | , , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
National Academy of Sciences
2006
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC1413780/ https://ncbi.nlm.nih.gov/pubmed/16467139 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.0508070103 |
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