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Treatment of Low Angle X-Ray Data from Planar and Concentric Multilayered Structures
Low angle X-ray diffraction can be recorded from planar and concentric multilayered (biological) structures. In order to proceed with the X-ray analysis the relation between the observed intensities and the Fourier transform of the unit cell is required. This relation is derived for planar structure...
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| Autori principali: | , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
1966
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC1367947/ https://ncbi.nlm.nih.gov/pubmed/5963461 |
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