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Dielectric Behavior of Yeast Cells Treated with HgCl(2) and Cetyl Trimethyl Ammonium Bromide

The change in dielectric properties caused by the destruction of the transport barrier of yeast cells has been investigated. Dielectric measurements were made over the frequency range of 1 kc to 2 Mc by using “leaky” yeast cells prepared by treatments with HgCl(2) or CTAB (cetyl trimethyl ammonium b...

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Hlavní autoři: Sugiura, Yoshihiko, Koga, Shozo
Médium: Artigo
Jazyk:Inglês
Vydáno: 1965
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC1367886/
https://ncbi.nlm.nih.gov/pubmed/5864849
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