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Phase determination of x-ray reflections for membrane-type systems with constant fluid density.

A new technique for phase determination of X-ray reflections from symmetric structures is presented. This method, involving comparison of intensity data from structures with variable fluid layer thickness and constant fluid electron density, permits computation of phase angles, scaling factors, and...

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Detalhes bibliográficos
Main Authors: Stamatoff, J B, Krimm, S
Formato: Artigo
Idioma:Inglês
Publicado em: 1976
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC1334871/
https://ncbi.nlm.nih.gov/pubmed/1276379
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