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From images to interactions: high-resolution phase imaging in tapping-mode atomic force microscopy.

In tapping-mode atomic force microscopy, the phase shift between excitation and response of the cantilever is used as a material-dependent signal complementary to topography. The localization of information in the phase signal is demonstrated with 1.4-nm lateral resolution on purple membrane of Halo...

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Detalhes bibliográficos
Main Authors: Stark, M, Möller, C, Müller, D J, Guckenberger, R
Formato: Artigo
Idioma:Inglês
Publicado em: 2001
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC1301484/
https://ncbi.nlm.nih.gov/pubmed/11371473
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