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Whole-genome comparative analysis of three phytopathogenic Xylella fastidiosa strains

Xylella fastidiosa (Xf) causes wilt disease in plants and is responsible for major economic and crop losses globally. Owing to the public importance of this phytopathogen we embarked on a comparative analysis of the complete genome of Xf pv citrus and the partial genomes of two recently sequenced st...

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書誌詳細
主要な著者: Bhattacharyya, Anamitra, Stilwagen, Stephanie, Ivanova, Natalia, D'Souza, Mark, Bernal, Axel, Lykidis, Athanasios, Kapatral, Vinayak, Anderson, Iain, Larsen, Niels, Los, Tamara, Reznik, Gary, Selkov, Eugene, Walunas, Theresa L., Feil, Helene, Feil, William S., Purcell, Alexander, Lassez, Jean-Louis, Hawkins, Trevor L., Haselkorn, Robert, Overbeek, Ross, Predki, Paul F., Kyrpides, Nikos C.
フォーマット: Artigo
言語:Inglês
出版事項: National Academy of Sciences 2002
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オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC129457/
https://ncbi.nlm.nih.gov/pubmed/12205291
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.132393999
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