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Detection of Chromosomal Aberrations by a Whole-Genome Microsatellite Screen

Chromosomal aberrations are a common cause of multiple anomaly syndromes that include developmental and growth retardation. Current microscopic techniques are useful for the detection of such aberrations but have a limit of resolution that is above the threshold for phenotypic effect. We hypothesize...

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Detalhes bibliográficos
Main Authors: Rosenberg, Marjorie J., Vaske, David, Killoran, Christina E., Ning, Yi, Wargowski, David, Hudgins, Louanne, Tifft, Cynthia J., Meck, Jeanne, Blancato, Jan K., Rosenbaum, Kenneth, Pauli, Richard M., Weber, James, Biesecker, Leslie G.
Formato: Artigo
Idioma:Inglês
Publicado em: 2000
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC1288094/
https://ncbi.nlm.nih.gov/pubmed/10677301
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