Mapping interaction forces with the atomic force microscope.

Force curves were recorded as the sample was raster-scanned under the tip. This opens new opportunities for imaging with the atomic force microscope: several characteristics of the samples can be measured simultaneously, for example, topography, adhesion forces, elasticity, van der Waals, and electr...

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Bibliografiske detaljer
Main Authors: Radmacher, M, Cleveland, J P, Fritz, M, Hansma, H G, Hansma, P K
Format: Artigo
Sprog:Inglês
Udgivet: 1994
Fag:
Research Article
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC1275941/
https://ncbi.nlm.nih.gov/pubmed/8075349
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