Atomic force microscopy of Precambrian microscopic fossils

Atomic force microscopy (AFM) is a technique used routinely in material science to image substances at a submicron (including nm) scale. We apply this technique to analysis of the fine structure of organic-walled Precambrian fossils, microscopic sphaeromorph acritarchs (cysts of planktonic unicellul...

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Dades bibliogràfiques

Publicat a:	Proc Natl Acad Sci U S A
Autors principals:	Kempe, André, Schopf, J. William, Altermann, Wladyslaw, Kudryavtsev, Anatoliy B., Heckl, Wolfgang M.
Format:	Artigo
Idioma:	Inglês
Publicat:	National Academy of Sciences 2002
Matèries:	Physical Sciences
Accés en línia:	https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC123103/ https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/12089337/ https://ncbi.nlm.nih.govhttps://doi.org/10.1073/pnas.142310299
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