Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case

We present an overview of the bimodal amplitude–frequency-modulation (AM-FM) imaging mode of atomic force microscopy (AFM), whereby the fundamental eigenmode is driven by using the amplitude-modulation technique (AM-AFM) while a higher eigenmode is driven by using either the constant-excitation or t...

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Detalhes bibliográficos
Main Authors: Daniel Ebeling, Santiago D. Solares
Formato: Artigo
Idioma:Inglês
Publicado em: Beilstein-Institut 2013-03-01
Colecção:Beilstein Journal of Nanotechnology
Assuntos:
amplitude-modulation
atomic force microscopy
frequency-modulation
phase-locked loop
spectroscopy
Acesso em linha:https://doi.org/10.3762/bjnano.4.20
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