Investigations on Structural, Electrical and Optical Properties of Polycrystalline CdInTe Thin Films Grown by Thermal Evaporation

Abstract: In this study, properties of thermally evaporated polycrystalline CdInTe thin films were investigated. The surface morphology, composition and crystal structure of the films were determined by means of SEM, EDXA and XRD analysis. Temperature dependent Hall effect measurements were carried...

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Detalhes bibliográficos
Main Authors: Koray Yılmaz, Deniz Gölcür
Formato: Artigo
Idioma:Inglês
Publicado em: Suleyman Demirel University 2014-07-01
Colecção:Süleyman Demirel Üniversitesi Fen-Edebiyat Fakültesi Fen Dergisi
Assuntos:
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Semiconductors
thin films
thermal evaporation
Hall effect
Yarıiletken
ince film
termal buharlaştırma
Hall etkisi
Acesso em linha:http://dergipark.gov.tr/sdufeffd/issue/11279/134784?publisher=sdu-1
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