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Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films
The Boltzmann equation is a semiclassical approach to the calculation of the electrical conductivity. In this work we will first introduce a simple model for calculation of thin film resistivity and show that in an appropriate condition the resistivity of thin films depends on the electron mean free...
保存先:
| 第一著者: | |
|---|---|
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Isfahan University of Technology
2007-09-01
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| シリーズ: | Iranian Journal of Physics Research |
| 主題: | |
| オンライン･アクセス: | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-110&slc_lang=en&sid=1 |
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