A Durability Model for Analysis of Switching Direct Current Surge Degradation of Metal Oxide Varistors

In this study, a durability model for predicting the lifetime of MOV devices used to prevent DC switch damage due to occasional switching surges is proposed and validated. In addition, MOV devices are subjected to induced switching DC surges of a constant amplitude and variable time durations. Each...

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Bibliographic Details
Main Authors: Daniel van Niekerk, Pitshou Bokoro
Format: Artigo
Language:Inglês
Published: MDPI AG 2022-04-01
Series:Electronics
Subjects:
degradation
durability
switching DC surges
metal oxide varistor
energy handling capability
reference voltage
Online Access:https://www.mdpi.com/2079-9292/11/9/1329
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