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A Durability Model for Analysis of Switching Direct Current Surge Degradation of Metal Oxide Varistors
In this study, a durability model for predicting the lifetime of MOV devices used to prevent DC switch damage due to occasional switching surges is proposed and validated. In addition, MOV devices are subjected to induced switching DC surges of a constant amplitude and variable time durations. Each...
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| Autori principali: | , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
MDPI AG
2022-04-01
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| Serie: | Electronics |
| Soggetti: | |
| Accesso online: | https://www.mdpi.com/2079-9292/11/9/1329 |
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